Home Company News Plat.AI Talks Tech at JSM Conference

Plat.AI Talks Tech at JSM Conference

Published by Ani Mosinyan at August 14, 2023

Plat.AI was pleased to attend JSM this August in Toronto, Canada.

The team’s primary goal this year was to cultivate heightened visibility and expand the user base of its AutoML platform.

JSM 2023, organized by the American Statistical Association, is a premier event for statisticians and data scientists to share knowledge, foster collaborations, and explore the latest in statistical theory and application. The conference featured presentations and workshops on key topics such as machine learning, Bayesian inference, and computational statistics.

One of the highlights of the event was the presentation by Senior Data Analyst Arsen Hovasapyan on ‘Risk Analysis in Economics and Environmental Study Session.’ The presentation delved into the realm of real-time stress testing in credit risk management. The session attracted an esteemed audience, including professors and Ph.D. students from institutions such as the University of Michigan-Dearborn, HEC Montreal, Zelus Analytics, the University of Alabama, and the University of Wisconsin-Milwaukee.

Plat.AI looks ahead with renewed inspiration to continue refining its AutoML platform, incorporating the insights gained from this conference. The connections made and lessons learned will undoubtedly shape the company’s trajectory as it strives to empower businesses and individuals with powerful AI-driven tools. We extend our gratitude to the American Statistical Association and all the attendees who made this event not only possible but exceptionally enriching.


Ani Mosinyan

Ani Mosinyan

Content ManagerAni Mosinyan is the Content Manager for PLAT.ai. She has worked for publications such as Rare Bird Books and The Hollywood Reporter. She has a background in English literature and film studies, as well as creative writing and experience in literary publishing. In her free time, she enjoys hiking, writing poetry, and watching old films.